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SEM-EDX

Scanning Electron Microscopy (SEM) analysis is an analytical technique used to produce high resolution images to analyze a wide range of materials for visualization and characterization of surfaces.

Energy Dispersive X-ray Spectroscopy (EDS) is an analytical technique used for chemical characterization and elemental analysis of materials. With the use of SEM-EDS analysis, surface fractures, surface contaminants, and localized corrosion residue can be analyzed to determine their origins.

Testing Standards/ Code Considerations